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[Show Coverage]
DAC And IMS Shows Offer An Early Peek At Critical Technologies

John Blyler
May 2004

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Why do important conferences always seem to take place at the same time?
For example, both the Design Automation Conference (www.dac.com/41st) and the IEEE International Microwave Symposium (www.ims2004.org) take place the week of June 7, 2004. Both conferences offer topics and exhibits that are crucial to the design of today's wireless systems. Yet their scheduling makes it difficult—albeit not impossible—for engineers to attend both shows. To help those engineers stay informed, this section highlights products from both conferences.

First, consider the world of electronic design tools. Most electronic-design-automation (EDA) companies are just now recovering from the technology slump of the last several years. Many are doing so with a renewed awareness of the "bottom line." This trend has not escaped the notice of the planners of this year's Design Automation Conference (DAC). In addition to a strong technical program, the conference features an expanded business-related session. Called "Business Day at DAC," it includes a track on the intersection of business and technology issues. DAC will be held from June 7 to 9 at the San Diego Convention Center in San Diego, Calif.

Meanwhile, Fort Worth, Texas will be hosting the IEEE IMS show from June 6 to 11. This show covers the RF—specifically microwave—portion of wireless designs. The symposium works to include everything that's needed in the development of RF subsystems. Topics vary from contemporary issues, such as EDA flows in RFICs and UWB technologies, to the equally important yet more mundane tasks of selecting between an organic or ceramic board.

Of course, both show floors will be lined with products and more products. The following pages provide a glimpse of some of the hottest products to grace the floors of this year's DAC and IMS.





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DAC And IMS Shows Offer An Early Peek At Critical Technologies
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